| 8:15-9:10 |
Refreshments, Registration & Expo |
|
| 9:10-9:15 |
Welcome |
by Shuka Zernovizky, SemIsrael
|
| 9:15-9:40 |
Test Capabilities, Roadmap and Innovation for Test Cost Reduction |
by Nicolas Calberac, Director - Test Business Development, Amkor Technology |
| 9:40-10:00 |
Low DPM and High Yield: From the DFT Engineering Manager’s perspective |
by Kan Thapar, DFT Applications Manager, Mentor Graphics
|
| 10:00-10:20 |
A New Flow to Convert First Silicon SEM Images to Electrical Performance Data |
by Ofer Adan, Technology and Marketing Manager, CDSEM Product Line, AMAT |
| 10:20-10:40 |
Synopsys Galaxy Test Solution |
by Stefan Kranzdorf, Staff Applications Consultant, Synopsys
|
| 10:40-11:00 |
Outlook on Considerations for Selecting a Test Platform |
by Arie Barak, Managing Director, Verigy Israel |
| 11:00-11:20 |
Advanced ICs – test challenges |
by Moty Weisblum, Cellular Operations Manager, Marvell Israel
|
| 11:20-11:40 |
Getting Ahead of the Game - Optimizing Testability Early |
by Kiran Vittal, Product Marketing Director, Atrenta |
| 11:40-12:15 |
Coffee, Snacks & Visit to the Expo |
|
| 12:15-12:35 |
Failure Analysis & Test for Product Engineering: How to Close the Loop |
by Cedric Mayor, Director of R&D, Presto Engineering |
| 12:35-12:55 |
POE: Example of Flexibility and Integration |
by Alberto Crescenzio, President & CEO, Euro Instruments Trading |
| 12:55-13:20 |
Amkor View on Packaging Technology |
by Amkor Technology
|
| 13:20-13:40 |
Important Considerations when Selecting Your Test Partner |
by Tom Mordue, Executive Accounts Manager, Integra Technologies |
| 13:40-14:00 |
Controlling the testing supply chain – Fabless-Foundry-Subcon |
by Dan Glotter, CEO - Optimal Test |
| 14:00-14:20 |
How To Quickly Turn Test Data Into Intelligent Information |
by Wes Smith, Director of Engineering and Customer Support, Galaxy Semiconductors |
| 14:20-15:30 |
Lunch
|
|
| 15:30-16:00 |
Desert, Lucky Draw, Visit to the Expo
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