| 8:45-9:15 |
Refreshments, Registration & Expo |
|
| 9:15-9:20 |
Welcome |
by Shuka Zernovizky, SemIsrael
|
| 9:20-9:40 |
Increasing Need for Quality of Manufacturing Test and Diagnostics for yield Improvement |
by Kan Thapar, European Team Leader - DFT Solutions, Mentor Graphics |
| 9:40-10:00 |
Scope and Scale |
by Jon Kassam – Europe Test Project Director, Amkor
|
| 10:00-10:20 |
Silicon Release Solutions: Bridging The Gap From DFT Through Engineering to Low-Cost Production |
by Lorenzo Simonini, Europe Marketing Manager - Global Services, Teradyne |
| 10:20-10:40 |
Innovative Solutions For Challenging Test Problems |
by Dror Regev, HSC Director, Presto Engineering |
| 10:40-11:30 |
Optimal Test- Supply Chain Management – Demo Cases |
by Yoram Sacagiu,Israel Sales Manager, Optimal Test
|
| 11:30-12:00 |
Coffee, Snacks & Visit to the Expo |
|
| 12:00-12:20 |
HTOL Testing of Low Geometry High Power VLSI Devices |
by Mark Ashley – Managing Director – Reltech |
| 12:20-12:40 |
Looking into the Future of ATE Loadboards |
by Thomas P. (Phil) Warwick, VP and CTO - R&D Circuits |
| 12:40-13:00 |
Synopsys Test Solution - Top-down Flow With Existing DFTMAX Cores |
by Mattan Tsachi - Applications Consultant Synopsys |
| 13:00-14:30 |
Lunch, Desert, Lucky Draw, Visit to the Expo
|
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