SemIsrael Blogs
Boris Fichtman

Boris Fichtman

Boris Fichtman, PhD.
Faculty of Medicine in the Galilee,
Bar Ilan University, Safed,

Scanning Electron Microscopy imaging of non-conductive, conductive, and magnetic samples at magnifications up to 2.000.000x with a resolution on the order of single nanometers is possible using state of art Ultra High Resolution SEM "Merlin" of ZEISS. The microscope equipped with a Gemini II column enable three different modes of imaging (analytic, high resolution, depth of focus), wide variety of electron landing energies and beam currents. Routine applications include quality control, failure analysis, reverse engineering, surface topography, nano-comtamination analysis and more.

Strengths and Advantages:
Gemini II column provides:
Probe diameter – 0.8 nm at 30 kV, 1.4 nm at 1 kV.
Beam landing energy – from 50 V up to 30 kV
Beam current – from 5 pA up to 300nA
Charge compensation for non-conductive samples
Magnetic samples imaging

Detectors and analysis available:
In-lens SE - high resolution surface topography analysis.
In-lens ESB (Energy Selected BSE) - Compositional and chemical bonds analysis.
E-T SE2 - 3D surface imaging.
ASB - Crystal lattice orientation.

Contact:

Boris Fichtman, PhD.
Faculty of Medicine in the Galilee,
Bar Ilan University, Safed, Israel.
Cell: 972-52-3466058
Office: 972-72-2644924
Website: http://medweb.md.biu.ac.il/research/amnon-harel/
Email: bfichtman at gmail.com