SemIsrael Test Conference 2010

Welcome to SemIsrael Test Conference  

The Largest and Most Focused Event for the Test @ Product Sector!

Read The Full Event Agenda

Venue: Green House, Tel Aviv (map)
Date: December 14th, 2010
Time: 8:30AM - 15:30PM

  • A First of its Kind in Israel - Largest and Most Focused Event for the Test @ Product Sector!
  • Uniquely tailored  for Test & Product Professionals and Executives

Why should you attend the SemIsrael Test Conference:

  • Come and meet the Who's Who in the Test & Product space
  • Get the most updated current technology and know-how from leading vendors
  • Best networking event
  • Enjoy the unique ambience and quality of SemIsrael professional  events


8:15-9:10 Refreshments, Registration & Expo  
9:10-9:15 Welcome by Shuka Zernovizky, SemIsrael
9:15-9:40 Test Capabilities, Roadmap and Innovation for Test Cost Reduction by Nicolas Calberac, Director - Test Business Development, Amkor Technology
9:40-10:00 Low DPM and High Yield: From the DFT Engineering Manager’s perspective by Kan Thapar, DFT Applications Manager, Mentor Graphics
10:00-10:20 A New Flow to Convert First Silicon SEM Images to Electrical Performance Data by Ofer Adan, Technology and Marketing Manager, CDSEM Product Line, AMAT
10:20-10:40 Synopsys Galaxy Test Solution by Stefan Kranzdorf, Staff Applications Consultant, Synopsys
10:40-11:00 Outlook on Considerations for Selecting a Test Platform by Arie Barak, Managing Director, Verigy Israel
11:00-11:20 Advanced ICs – test challenges by Moty Weisblum, Cellular Operations Manager, Marvell Israel
11:20-11:40 Getting Ahead of the Game - Optimizing Testability Early by Kiran Vittal, Product Marketing Director, Atrenta
11:40-12:15 Coffee, Snacks & Visit to the Expo  
12:15-12:35 Failure Analysis & Test for Product Engineering: How to Close the Loop by Cedric Mayor, Director of R&D, Presto Engineering
12:35-12:55 POE: Example of Flexibility and Integration by Alberto Crescenzio, President & CEO, Euro Instruments Trading
12:55-13:20 Amkor View on Packaging Technology by Amkor Technology
13:20-13:40 Important Considerations when Selecting Your Test Partner by Tom Mordue, Executive Accounts Manager, Integra Technologies
13:40-14:00 Controlling the testing supply chain – Fabless-Foundry-Subcon by Dan Glotter, CEO - Optimal Test
14:00-14:20 How To Quickly Turn Test Data Into Intelligent Information by Wes Smith, Director of Engineering and Customer Support, Galaxy Semiconductors
14:20-15:30 Lunch
15:30-16:00 Desert, Lucky Draw, Visit to the Expo  



Participation is free -  and early registration is required.

Please fill in your personal details to guarantee your participation .

Required Fields:

Event is Over, and Registration is Closed

  • id
  • date
  • Date