SemIsrael Test Conference 2012
Welcome to SemIsrael Test Conference 2012
The Largest and Most Focused Event for the Test @ Product Sector!
Read The Full Event Agenda
Venue: Green House, Tel Aviv (map)
Date: January 24., 2013 (note - date is changed from Dec.4, 2012 to Jan. 24, 2013!)
Time: 8:45AM - 14:30PM
- For the 3rd time in Israel - The Largest and Most Focused Event for the Test @ Product Sector!
- Uniquely tailored for Test & Product Professionals and Executives
Why should you attend the SemIsrael Test Conference:
- Come and meet the Who's Who in the Test & Product space
- Get the most updated current technology and know-how from leading vendors
- Best networking event
- Enjoy the unique ambience and quality of SemIsrael professional events
Agenda:
| 8:45-9:15 | Refreshments, Registration & Expo | |
| 9:15-9:20 | Welcome | By Shuka Zernovizky, SemIsrael |
| 9:20-9:40 | Let’s Talk About Test Quality: Past, Present and Future | By Evgeny Polyakov, Euro Application Engineer, DFT solutions, Mentor Graphics |
| 9:40-10:00 | Expanding ATE Capabilities for High-Frequency Designs | By Dror Regev, Director of High-Speed Communications Solutions, Presto Engineering Israel |
| 10:00-10:20 | ATE solutions to 3DIC test challenges. The Readiness of Advantest’s V93000 | By Scott Chesnut, Expert RF/Baseband Applications Engineer, Advantest |
| 10:20-10:40 | Testing and Yield improvement with DesignWare SMS | By Noam Babayof, Technical Expert, Synopsys |
| 10:40-11:00 | High Speed Loopback Test and Relays | By Thomas P. (Phil) Warwick, VP & CTO, R&D Circuits |
| 11:00-11:30 | Testing with an OSAT - How to Overcome The Challenges? | By Nicolas Calberac, Director - Test Business Development, Amkor Technology |
| 11:30-12:00 | Coffee, Snacks & Visit to the Expo | |
| 12:00-12:20 | Managing Test Programs - From Spec to Implementation and Maintenance | By Meir Gellis, CEO, TestInsight |
| 12:20-12:40 | Reducing Your Development and Production Costs with the UltraFLEX: RF and Digital Protocol Aware, Concurrent Test | By Lorenzo Simonini, Services Marketing Manager, Teradyne |
| 12:40-13:00 | Reduced Cost of Test Through Sustainable Contacts | By Mario Patane, Field Application Engineer, Interconnect Devices (IDI) |
| 13:00-13:20 | YieldHUB: The Game-changing Private Cloud Yield Analysis Solution | By John O'Donnell, CEO, MFG Vision |
| 13:20-14:30 | Lunch, Desert, Lucky Draw, Visit to the Expo |
Participation is free - and early registration is required.
Please fill in your personal details to guarantee your participation .
