SemIsrael Test Conference 2012

Welcome to SemIsrael Test Conference 2012   

The Largest and Most Focused Event for the Test @ Product Sector!

Read The Full Event Agenda

Venue: Green House, Tel Aviv (map)
Date: January 24., 2013 (note - date is changed from Dec.4, 2012 to Jan. 24, 2013!)
Time: 8:45AM - 14:30PM

  • For the 3rd time in Israel - The Largest and Most Focused Event for the Test @ Product Sector!
  • Uniquely tailored  for Test & Product Professionals and Executives


Why should you attend the SemIsrael Test Conference:

  • Come and meet the Who's Who in the Test & Product space
  • Get the most updated current technology and know-how from leading vendors
  • Best networking event
  • Enjoy the unique ambience and quality of SemIsrael professional  events

 


 

Agenda:

8:45-9:15 Refreshments, Registration & Expo  
9:15-9:20 Welcome By Shuka Zernovizky, SemIsrael
9:20-9:40 Let’s Talk About Test Quality: Past, Present and Future By Evgeny Polyakov, Euro Application Engineer, DFT solutions, Mentor Graphics
9:40-10:00 Expanding ATE Capabilities for High-Frequency Designs By Dror Regev, Director of High-Speed Communications Solutions, Presto Engineering Israel
10:00-10:20 ATE solutions to 3DIC test challenges. The Readiness of Advantest’s V93000 By Scott Chesnut, Expert RF/Baseband Applications Engineer, Advantest
10:20-10:40 Testing and Yield improvement with DesignWare SMS By Noam Babayof, Technical Expert, Synopsys
10:40-11:00 High Speed Loopback Test and Relays By Thomas P. (Phil) Warwick, VP & CTO, R&D Circuits
11:00-11:30 Testing with an OSAT - How to Overcome The Challenges? By Nicolas Calberac, Director - Test Business Development, Amkor Technology
11:30-12:00 Coffee, Snacks & Visit to the Expo  
12:00-12:20 Managing Test Programs - From Spec to Implementation and Maintenance By Meir Gellis, CEO, TestInsight
12:20-12:40 Reducing Your Development and Production Costs with the UltraFLEX: RF and Digital Protocol Aware, Concurrent Test By Lorenzo Simonini, Services Marketing Manager, Teradyne
12:40-13:00 Reduced Cost of Test Through Sustainable Contacts By Mario Patane, Field Application Engineer, Interconnect Devices (IDI)
13:00-13:20 YieldHUB: The Game-changing Private Cloud Yield Analysis Solution By John O'Donnell, CEO, MFG Vision
13:20-14:30 Lunch, Desert, Lucky Draw, Visit to the Expo
 

 

 


 

Participation is free -  and early registration is required.

Please fill in your personal details to guarantee your participation .

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Event is Over, and Registration is Closed

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SemIsrael Test Conference: Jan. 24, 2013